METHOD FOR CONTROLLING CIRCUIT BOARD INSPECTING DEVICE

PROBLEM TO BE SOLVED: To obtain the real location of the center of rotation of a substrate inspecting base more accurately by computations in the case that the rotation of the substrate inspecting base can be controlled. SOLUTION: This method comprises both a table movable in X-Y directions on which a circuit board to be inspected is mounted and a probe pin to be in contact with the circuit board to be inspected, includes a substrate inspecting base 6 rotatable on the axis of rotation vertical with respect to the table, a camera to pick up an image over the surface of the table, and an image processing means, and obtains the difference between the location of the center of rotation of the substrate inspecting base 6 by design and the real location of the center of rotation to control the amount of movement of the table, etc. In this case, one probe pin for forming nicks is mounted to the substrate inspecting base 6, and three nicks 1-3 are formed by the probe pin for forming nicks while rotating the probe pin by 360 deg.. Then the real location of the center of rotation of the substrate inspecting base 6 is computed by the formula of circles from the coordinate data of the three nicks obtained by the camera and image processing means.