DELAY FORMULA DERIVING METHOD, TEST PATTERN, LSI CHIP, CALCULATING METHOD AND CALCULATION DEVICE

PROBLEM TO BE SOLVED: To efficiently decide a delay formula which is matched with actual delay with sufficient precision by obtaining the values of two types of coefficients contained in a delay formula model used for delay between gates from the oscillation frequency of a ring oscillator and deciding the delay formu la. SOLUTION: Two or more types of ring oscillators are formed on a semiconductor chip and the values of two types of coefficients contained in a delay formula used for delay between gates are obtained and the delay formula is decided. The values of the two types of unknown coefficients are obtained by solving a linear simultaneous equation with two unknowns formed on the basis of delay quantity per stage which is obtained from the measured oscillation frequency of the ring oscillator and from a delay model. In an LSI chip, for example, a ring oscillator pattern group 50 containing two types of ring oscillators and a wiring characteristic pattern 51 are formed in a process forming a semiconductor integrated circuit 53 on the chip.