PHOTORESIST COMPOSITION CONTAINING CYCLIC OLEFIN POLYMER AND ADDITIVE

PROBLEM TO BE SOLVED: To obtain a photoresist composition using an acid as a catalyst, capable of forming an image with radiation of 193 nm and capable of forming a photoresist structure having high resolution and high etching resistance by development. SOLUTION: The photoresist composition comprise...

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Hauptverfasser: ANN MARIE MYUUHAATAA, JOSEPH F MANISCALCO, MAHAMUUDO EMU HOJISUTE, VARANASI PUSHKARA RAO, ALLEN ROBERT D, TOMAS I WOROU, ITO HIROSHI, JULIAN OPITZ, JORDHAMO GEORGE M, DEPIETRO RICHARD A, MARGARET C LAWSON
Format: Patent
Sprache:eng
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Zusammenfassung:PROBLEM TO BE SOLVED: To obtain a photoresist composition using an acid as a catalyst, capable of forming an image with radiation of 193 nm and capable of forming a photoresist structure having high resolution and high etching resistance by development. SOLUTION: The photoresist composition comprises a combination of a cyclic olefin polymer, a photosensitive acid-generating agent and a substantially transparent bulky hydrophobic additive. The cyclic olefin polymer contains a cyclic olefin unit having a polar functional group which promotes dissolution in an aqueous alkali solution and the cyclic olefin unit having an acid-labile group which inhibits the dissolution in the aqueous alkali solution. The hydrophobic additive is selected from the group comprising a saturated steroid compound, a non-steroid cycloaliphatic compound and a non-steroid polycycloaliphatic compound having an acid-labile bond.