HOLDING DEVICE FOR ANALYTICAL SAMPLE AND ANALYTICAL METHOD FOR SAMPLE

PROBLEM TO BE SOLVED: To provide a holding device for an analytical sample and an analytical method for the sample in an analytical device for the sample which can speedily and certainly distinguish a sample position from detected data by scanning the sample without depending on the mechanical accur...

Ausführliche Beschreibung

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Bibliographische Detailangaben
1. Verfasser:	RYU KOSUKE
Format:	Patent
Sprache:	eng
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING
Online-Zugang:	Volltext bestellen
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Beschreibung
Zusammenfassung:	PROBLEM TO BE SOLVED: To provide a holding device for an analytical sample and an analytical method for the sample in an analytical device for the sample which can speedily and certainly distinguish a sample position from detected data by scanning the sample without depending on the mechanical accuracy of the device. SOLUTION: In a holding device for a sample to be analized for an analytical device which holds the sample on a surface of a sample holding substrate 2 that can perform scanning in XY directions through application of a beam thereto and optically detects the sample which is irradiated with the beam, a pattern 13 for distinguishing a sample position in which slits 14 are formed in a sample holding part is formed on the surface of this substrate 2.