WAFER CARRIER

PROBLEM TO BE SOLVED: To stably control variations in the surface resistance of molded articles by forming a wafer carrier of a polyether aromatic ketone having a repeating unit expressed by a prescribed formula and of carbon fiber, having a prescribed diameter and a prescribed length and by control...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: SATO TAKASHI, YANAGIHARA KAYAKO, YOSHIMURA MASAJI
Format: Patent
Sprache:eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:PROBLEM TO BE SOLVED: To stably control variations in the surface resistance of molded articles by forming a wafer carrier of a polyether aromatic ketone having a repeating unit expressed by a prescribed formula and of carbon fiber, having a prescribed diameter and a prescribed length and by controlling the surface resistance of such a wafer carrier to be within a prescribed narrow range. SOLUTION: This wafer carrier contains 90-60 wt.% of polyether aromatic ketone and 10-40 wt.% of carbon fiber. The polyether aromatic ketone has a repeating unit expressed by a formula. The carbon fiber has an average fiber diameter of 3-25 μm and an average fiber length of 50-70,000 μm. Furthermore, the wafer carrier has a surface resistance R which satisfies the inequality. Rmin