INSPECTING DEVICE, WORKING DEVICE WITH INSPECTION FUNCTION AND INSPECTING METHOD FOR WORK

INSPECTING DEVICE, WORKING DEVICE WITH INSPECTION FUNCTION AND INSPECTING METHOD FOR WORK

PROBLEM TO BE SOLVED: To shorten the analyzing time of a characteristic wave-form. SOLUTION: A caulking device 11 caulking a rivet to a work is provided, and a load cell 12 measuring the caulking load when the caulking device 11 is operated is provided. Multiple measured data obtained by the load ce...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
1. Verfasser: TAKAI MASAHIRO
Format: Patent
Sprache:eng
Schlagworte:
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:PROBLEM TO BE SOLVED: To shorten the analyzing time of a characteristic wave-form. SOLUTION: A caulking device 11 caulking a rivet to a work is provided, and a load cell 12 measuring the caulking load when the caulking device 11 is operated is provided. Multiple measured data obtained by the load cell 12 are collected in a RAM 15 by a CPU 13. A characteristic wave-form for judging the quality of working is obtained by the CPU 13 in parallel with this collection. The measured data are not required to be analyzed and processed in a lump, thus the analyzing time of wave-forms 17-17 is largely shortened.