SEMICONDUCTOR INTEGRATED CIRCUIT AND TESTING METHOD FOR THE SAME

PROBLEM TO BE SOLVED: To enable a test of high accuracy wherein, with a simple circuit with few number of gates, a test pattern is easily generated, related to a test of an input/output part of a semiconductor integrated circuit. SOLUTION: A bidirectional pin function is provided to all of input pins used at normal operation and a general signal pin used at output pin operation. For that purpose, a control gate TG for controlling input/output switching of a bidirectional pin IO is provided to control an input/output attribute of the bidirectional pin. A flip-flop FF is connected to the input side of the bidirectional pin and the output of the flip-flop is connected to the output side of a nearby bidirectional pin. With this configuration, for each group of pins for input pin IN and output pin OUT operations on normal operation, a pair is made of two pins, and the other side outputs a value latched with the flip- flop, respectively. From the input and output, the failure at an input/output part and its point are detected. A setup value/hold value of flip-flop connected to each pin is acquired with a commercial tester function for calibrating a real operation clock for functional test.