METHOD AND DEVICE FOR OBTAINING INSPECTION POINT POSITION

PROBLEM TO BE SOLVED: To find the position of an arbitrary point in an inspection area included in the plane of a structure to be inspected on the plane. SOLUTION: An actual size coordinate system is set by installing four indexes on the plane structure 4. Two kinds of wide-area and narrow-area digi...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: KONDO TAKESHI, OHATA MASAYOSHI, DOIHARA TAKESHI, ODA KAZUO
Format: Patent
Sprache:eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:PROBLEM TO BE SOLVED: To find the position of an arbitrary point in an inspection area included in the plane of a structure to be inspected on the plane. SOLUTION: An actual size coordinate system is set by installing four indexes on the plane structure 4. Two kinds of wide-area and narrow-area digital images of the plane structure are obtained by a camera 1 and a film reader 2. A data process part 3 calculates a first projection conversion coefficient from the pixel coordinates and actual size coordinates of the four indexes in the wide-area image. A second projection conversion coefficient is calculated on the basis of coordinate information on two corresponding places in the narrow-area and wide-area images. For the narrow-area image, an arbitrary point to be inspected is inputted and coordinate conversion is performed by using the first projection conversion coefficient and second projection conversion coefficient.