ELECTROOPTICAL SAMPLING OSCILLOSCOPE AND PROBE FOR ELECTROOPTICAL SAMPLING OSCILLOSCOPE

PROBLEM TO BE SOLVED: To provide an electrooptical sampling oscilloscope(EOS oscilloscope) capable of not only observing a measured signal but measuring the transmission characteristic of a measured circuit. SOLUTION: This EOS oscilloscope includes a timing generation circuit 4 provided on the EOS o...

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Bibliographische Detailangaben
Hauptverfasser: ENDO YOSHIO, NAGATSUMA TADAO, TOMOSHIRO CHOICHI, YAMADA JUNZO, SHINAGAWA MITSURU, TAKEUCHI NOBUNARI, KIKUCHI JUN, YANAGISAWA KOJU
Format: Patent
Sprache:eng
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Zusammenfassung:PROBLEM TO BE SOLVED: To provide an electrooptical sampling oscilloscope(EOS oscilloscope) capable of not only observing a measured signal but measuring the transmission characteristic of a measured circuit. SOLUTION: This EOS oscilloscope includes a timing generation circuit 4 provided on the EOS oscilloscope and a switching circuit for switching between each signal generated by a trigger circuit 3 and an external trigger signal in addition to the basic structure of the conventional EOS oscilloscope. In measuring the transmission characteristic, a trigger signal is input to a pulse generating circuit 9, and the pulse generating circuit 9 generates an electric pulse signal for measuring transmission characteristic or an optical pulse signal. When a response signal of the measured circuit to which the pulse signal is input is taken by an electrooptical prone 2, a processing circuit 7 converts the signal to transmission characteristic and displays the same on a display part. The tip of the electrooptical probe is removable so that a tip having a collimator condensing light to an optical fiber is used for the light input measured circuit.