RESIST SOLUTION AND FORMATION OF PATTERN

PROBLEM TO BE SOLVED: To obtain a method for forming a pattern, which surely forms a pattern having a stencil shape by a simple method, without being effected due to exposure systems, a high-step substrate, or a resist solution, which is used for the method. SOLUTION: A first resist solution formed...

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Hauptverfasser: ODAKA ISAMU, MEIKE KUNIHIKO, AKAGE YUICHI
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creator ODAKA ISAMU
MEIKE KUNIHIKO
AKAGE YUICHI
description PROBLEM TO BE SOLVED: To obtain a method for forming a pattern, which surely forms a pattern having a stencil shape by a simple method, without being effected due to exposure systems, a high-step substrate, or a resist solution, which is used for the method. SOLUTION: A first resist solution formed by a method, wherein a sensitizer within a resist solution is previously made to be decomposed with light irradiation, and the sensitiaer is turned into an indene ketene to put the indene ketene in a soluble state to alkali, is applied on a substrate 1 as a resist film 11, a second resist solution is applied on the film 11 as a resist film 12, ultraviolet rays are irradiated on the film 12 via a mask 3, and the films 11 and 12 are developed with an alkaline developing solution so as to form a pattern having a stencil shape 6.
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fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_JP2000100788A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>JP2000100788A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_JP2000100788A3</originalsourceid><addsrcrecordid>eNrjZNAIcg32DA5RCPb3CQ3x9PdTcPRzUXDzD_J1BPP83RQCHENCXIP8eBhY0xJzilN5oTQ3g5Kba4izh25qQX58anFBYnJqXmpJvFeAkYGBgaGBgbmFhaMxUYoAYPMkow</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>RESIST SOLUTION AND FORMATION OF PATTERN</title><source>esp@cenet</source><creator>ODAKA ISAMU ; MEIKE KUNIHIKO ; AKAGE YUICHI</creator><creatorcontrib>ODAKA ISAMU ; MEIKE KUNIHIKO ; AKAGE YUICHI</creatorcontrib><description>PROBLEM TO BE SOLVED: To obtain a method for forming a pattern, which surely forms a pattern having a stencil shape by a simple method, without being effected due to exposure systems, a high-step substrate, or a resist solution, which is used for the method. SOLUTION: A first resist solution formed by a method, wherein a sensitizer within a resist solution is previously made to be decomposed with light irradiation, and the sensitiaer is turned into an indene ketene to put the indene ketene in a soluble state to alkali, is applied on a substrate 1 as a resist film 11, a second resist solution is applied on the film 11 as a resist film 12, ultraviolet rays are irradiated on the film 12 via a mask 3, and the films 11 and 12 are developed with an alkaline developing solution so as to form a pattern having a stencil shape 6.</description><edition>7</edition><language>eng</language><subject>BASIC ELECTRIC ELEMENTS ; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ; ELECTRICITY ; SEMICONDUCTOR DEVICES</subject><creationdate>2000</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20000407&amp;DB=EPODOC&amp;CC=JP&amp;NR=2000100788A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20000407&amp;DB=EPODOC&amp;CC=JP&amp;NR=2000100788A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>ODAKA ISAMU</creatorcontrib><creatorcontrib>MEIKE KUNIHIKO</creatorcontrib><creatorcontrib>AKAGE YUICHI</creatorcontrib><title>RESIST SOLUTION AND FORMATION OF PATTERN</title><description>PROBLEM TO BE SOLVED: To obtain a method for forming a pattern, which surely forms a pattern having a stencil shape by a simple method, without being effected due to exposure systems, a high-step substrate, or a resist solution, which is used for the method. SOLUTION: A first resist solution formed by a method, wherein a sensitizer within a resist solution is previously made to be decomposed with light irradiation, and the sensitiaer is turned into an indene ketene to put the indene ketene in a soluble state to alkali, is applied on a substrate 1 as a resist film 11, a second resist solution is applied on the film 11 as a resist film 12, ultraviolet rays are irradiated on the film 12 via a mask 3, and the films 11 and 12 are developed with an alkaline developing solution so as to form a pattern having a stencil shape 6.</description><subject>BASIC ELECTRIC ELEMENTS</subject><subject>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</subject><subject>ELECTRICITY</subject><subject>SEMICONDUCTOR DEVICES</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2000</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZNAIcg32DA5RCPb3CQ3x9PdTcPRzUXDzD_J1BPP83RQCHENCXIP8eBhY0xJzilN5oTQ3g5Kba4izh25qQX58anFBYnJqXmpJvFeAkYGBgaGBgbmFhaMxUYoAYPMkow</recordid><startdate>20000407</startdate><enddate>20000407</enddate><creator>ODAKA ISAMU</creator><creator>MEIKE KUNIHIKO</creator><creator>AKAGE YUICHI</creator><scope>EVB</scope></search><sort><creationdate>20000407</creationdate><title>RESIST SOLUTION AND FORMATION OF PATTERN</title><author>ODAKA ISAMU ; MEIKE KUNIHIKO ; AKAGE YUICHI</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_JP2000100788A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2000</creationdate><topic>BASIC ELECTRIC ELEMENTS</topic><topic>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</topic><topic>ELECTRICITY</topic><topic>SEMICONDUCTOR DEVICES</topic><toplevel>online_resources</toplevel><creatorcontrib>ODAKA ISAMU</creatorcontrib><creatorcontrib>MEIKE KUNIHIKO</creatorcontrib><creatorcontrib>AKAGE YUICHI</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>ODAKA ISAMU</au><au>MEIKE KUNIHIKO</au><au>AKAGE YUICHI</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>RESIST SOLUTION AND FORMATION OF PATTERN</title><date>2000-04-07</date><risdate>2000</risdate><abstract>PROBLEM TO BE SOLVED: To obtain a method for forming a pattern, which surely forms a pattern having a stencil shape by a simple method, without being effected due to exposure systems, a high-step substrate, or a resist solution, which is used for the method. SOLUTION: A first resist solution formed by a method, wherein a sensitizer within a resist solution is previously made to be decomposed with light irradiation, and the sensitiaer is turned into an indene ketene to put the indene ketene in a soluble state to alkali, is applied on a substrate 1 as a resist film 11, a second resist solution is applied on the film 11 as a resist film 12, ultraviolet rays are irradiated on the film 12 via a mask 3, and the films 11 and 12 are developed with an alkaline developing solution so as to form a pattern having a stencil shape 6.</abstract><edition>7</edition><oa>free_for_read</oa></addata></record>
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subjects BASIC ELECTRIC ELEMENTS
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
SEMICONDUCTOR DEVICES
title RESIST SOLUTION AND FORMATION OF PATTERN
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-02T21%3A50%3A15IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=ODAKA%20ISAMU&rft.date=2000-04-07&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EJP2000100788A%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true