PULSE GENERATING CIRCUIT AND TESTER USING THE SAME

PROBLEM TO BE SOLVED: To provide a pulse generating circuit for realizing wide delay adjustment width, and generating a highly precise delay pulse, an a tester for realizing highly precise selection using this pulse generating circuit. SOLUTION: This pulse generating circuit to be used for a tester for measuring an LSI generates a pulse with an arbitrary delay time. This pulse generating circuit is constituted of a clock delay generating circuit 1 for generating a delay pulse in the cycle units of an inputted clock pulse, a gate delay generating circuit 2 for generating a delay pulse by gate delay based on the delay pulse outputted by the clock delay generating circuit 1, and a load delay generating circuit 3 for controlling a delay time according to an output load and generating a delay pulse based on the delay pulse outputted by the gate delay generating circuit 2. This pulse generating circuit is constituted by combining three circuit systems in which delay precision is different.