DURABILITY TEST DEVICE
PROBLEM TO BE SOLVED: To make suitably performable a durability test of electronic controller. SOLUTION: An input signal pattern generation part 31 generates an input signal pattern for an ECU 1, a switch part 32 generates the same simulation input signal as signals inputted to the input parts 13-15...
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Format: | Patent |
Sprache: | eng |
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Zusammenfassung: | PROBLEM TO BE SOLVED: To make suitably performable a durability test of electronic controller. SOLUTION: An input signal pattern generation part 31 generates an input signal pattern for an ECU 1, a switch part 32 generates the same simulation input signal as signals inputted to the input parts 13-15 of the ECU 1 corresponding to the input signal pattern and a simulation input signal generation means is constituted of them. A monitoring means 34 monitors the operation state of an actuator part 33 operated by operation signals outputted from the output parts 16 and 17 of the ECU 1 corresponding to the simulation input signal and judges whether the operation state is normal or abnormal for the simulation input signal. A CPU 41 counts the number of times for every execution of an operation test and displays the number of times of the operation test and the abnormal contents of the operation signals at the time of judging that the operation state is abnormal by the monitoring means 34 together at a CRT 39. |
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