CIRCUITO DI PROVA DI DISPOSITIVO AD EFFETTO HALL

CIRCUITO DI PROVA DI DISPOSITIVO AD EFFETTO HALL

A test circuit which detects Hall effect device operate and release time failures. This circuit includes a magnetic field circuit, a comparison circuit, a storage circuit and a visual indication circuit. The magnetic field circuit causes a Hall effect device under test to periodically switch states....

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
1. Verfasser: HENDRIK W. VAN HUSEN
Format: Patent
Sprache:ita
Schlagworte:
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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Beschreibung
Zusammenfassung:A test circuit which detects Hall effect device operate and release time failures. This circuit includes a magnetic field circuit, a comparison circuit, a storage circuit and a visual indication circuit. The magnetic field circuit causes a Hall effect device under test to periodically switch states. The operate and release times of such switching is compared to predetermined thresholds by the comparison circuit. Switching times within the allowable thresholds cause the storage circuit to operate the visual indication circuit.