APPARATO E METODO PER MISURA DI SOTTOCRITICITA

APPARATO E METODO PER MISURA DI SOTTOCRITICITA

A description is given of a method and a device for determining the subcriticality of uranium masses by directing (11) epithermal neutrons onto the mass, isolating (13) the material from external thermal neutrons and measuring (30, 32, 33, 34) the ratio of thermal and epithermal neutrons to epitherm...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: JAMES DAVID LANDRY, FREDERICK CARL SCHOENIG JR
Format: Patent
Sprache:ita
Schlagworte:
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
NUCLEAR ENGINEERING
NUCLEAR PHYSICS
NUCLEAR REACTORS
PHYSICS
TESTING
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Zusammenfassung:A description is given of a method and a device for determining the subcriticality of uranium masses by directing (11) epithermal neutrons onto the mass, isolating (13) the material from external thermal neutrons and measuring (30, 32, 33, 34) the ratio of thermal and epithermal neutrons to epithermal neutrons, which permits calculation (35) of a subcriticality value representative of the uranium mass.