TRANSISTORE MOS INTEGRATO CON DISABILITAZIONE SELETTIVA DELLE SUE CELLE
An integrated device (100) is proposed comprising at least one MOS transistor (105) having a plurality of cells (135,150). In each of one or more of the cells (135,150) a disabling structure (175,180) is provided; the disabling structure (175,180) is configured to be in a non-conductive condition wh...
Gespeichert in:
1. Verfasser: | |
---|---|
Format: | Patent |
Sprache: | ita |
Schlagworte: | |
Online-Zugang: | Volltext bestellen |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
Zusammenfassung: | An integrated device (100) is proposed comprising at least one MOS transistor (105) having a plurality of cells (135,150). In each of one or more of the cells (135,150) a disabling structure (175,180) is provided; the disabling structure (175,180) is configured to be in a non-conductive condition when the MOS transistor (105) is switched on in response to a control voltage comprised between a threshold voltage of the MOS transistor (105) and an intervention voltage of the disabling structure (175,180), or to be in a conductive condition otherwise. A system (400) comprising at least one integrated device (100) as above is also proposed. Moreover, a corresponding process for manufacturing this integrated device (100) is proposed. |
---|