PROCEDIMENTO PER LA RILEVAZIONE DI ALMENO UN PARAMETRO DI CARICA DI UNO SPAZIO CHIUSO MEDIANTE UNA APPARECCHIATURA DI RILEVAZIONE, NONCHE' APPARECCHIATURA DI RILEVAZIONE

PROCEDIMENTO PER LA RILEVAZIONE DI ALMENO UN PARAMETRO DI CARICA DI UNO SPAZIO CHIUSO MEDIANTE UNA APPARECCHIATURA DI RILEVAZIONE, NONCHE' APPARECCHIATURA DI RILEVAZIONE

A method of sensing at least one load parameter of a closed chamber by a sensing device by means of electromagnetic radiation is described, in which measurements of at least one measured variable are used. A first measurement is carried out when there is a first spatial distribution of the electric...

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Bibliographische Detailangaben
Hauptverfasser: MEO, FERNANDO, SCHWALB, DANIEL, ROEDIGER, PHILIPP, PIZZOLATO, ELISA
Format: Patent
Sprache:ita
Schlagworte:
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
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Zusammenfassung:A method of sensing at least one load parameter of a closed chamber by a sensing device by means of electromagnetic radiation is described, in which measurements of at least one measured variable are used. A first measurement is carried out when there is a first spatial distribution of the electric field generated by the electromagnetic radiation. At least a second measurement is carried out when there is a second spatial distribution of the electric field generated by the electromagnetic radiation, which differs from the first spatial distribution of the electric field.