Method to correct ion source inefficiencies makes sample-to-sample normalization possible

In mass spectrometry significant error is introduced during sample preparation (sample-to-sample error), during ion generation (ion suppression), and during ion transmission (ion transmission losses). We demonstrate the ability to correct for ion suppression and ion transmission losses, and that onc...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: BEECHER Christopher Willam Ward, DE JONG Felice
Format: Patent
Sprache:eng ; heb
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:In mass spectrometry significant error is introduced during sample preparation (sample-to-sample error), during ion generation (ion suppression), and during ion transmission (ion transmission losses). We demonstrate the ability to correct for ion suppression and ion transmission losses, and that once corrected for ion losses, a sample-to-sample normalization of the analytical sample to the internal standard is possible. By normalizing to a standard sample the analytical sample becomes completely comparable to any similarly treated sample.