CIRCUIT ARRANGEMENT FOR FORMING CALIBRATION SYSTEM, FOR AUTOMATIC ADJUSTING SYNCHRONISM OF SIGNALS OF THE DRIVING AND EVALUATING SIGNAL CHANNELS OF A MEASURING SYSTEM TESTING HIGH-COMPLEXITY DIGITAL INTEGRATED CIRCUITS WITHOUT EXTERNAL AID AND INTERVENTION IN AN OPTIONAL MOMENT, BY MEANS OF THE FUNCTIONAL UNITS OF THE MEASURING SYSTEM

Bibliographische Detailangaben

Hauptverfasser:	OLAH,CSABA,HU, TOMAN,GYOERGY,HU, KERI,DANIEL,HU, BORI,ZSUZSANNA,HU, SZARKA,ANDRAS,HU, BARTOS,IMRE,HU, VENER,PETER,HU, SZENCZI,ARPAD,HU, BERECZKY,KAROLY,HU, FUELOEPY,ATTILA,HU, TAKACS,FERENC,HU, DEKANY,BELA,HU
Format:	Patent
Sprache:	eng
Schlagworte:	CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
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