AUTOMATICAL MEASURING DEVICE FOR PARALLEL TESTING HIGH-COMPLEXITY INTEGRATED CIRCUITS, IN PARTICULAR MEMORY CIRCUITS

AUTOMATICAL MEASURING DEVICE FOR PARALLEL TESTING HIGH-COMPLEXITY INTEGRATED CIRCUITS, IN PARTICULAR MEMORY CIRCUITS

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Hauptverfasser: TOMAN,GYOERGY,HU, BEKE,LASZLO,HU, KERI,DANIEL,HU, SZARKA,ANDRAS,HU, SZEKELY,ISTVAN,HU, BARTOS,IMRE,HU, VENER,PETER,HU, SZENCZI,ARPAD,HU, FUELOEPY,ATTILA,HU, MIKOS,LASZLO,HU, TAKACS,FERENC,HU, DEKANY,BELA,HU
Format: Patent
Sprache:eng
Schlagworte:
CALCULATING
COMPUTING
COUNTING
DIGITAL COMPUTERS IN WHICH ALL THE COMPUTATION IS EFFECTEDMECHANICALLY
ELECTRIC DIGITAL DATA PROCESSING
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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creator TOMAN,GYOERGY,HU
BEKE,LASZLO,HU
KERI,DANIEL,HU
SZARKA,ANDRAS,HU
SZEKELY,ISTVAN,HU
BARTOS,IMRE,HU
VENER,PETER,HU
SZENCZI,ARPAD,HU
FUELOEPY,ATTILA,HU
MIKOS,LASZLO,HU
TAKACS,FERENC,HU
DEKANY,BELA,HU
description
format Patent
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language eng
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source esp@cenet
subjects CALCULATING
COMPUTING
COUNTING
DIGITAL COMPUTERS IN WHICH ALL THE COMPUTATION IS EFFECTEDMECHANICALLY
ELECTRIC DIGITAL DATA PROCESSING
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
title AUTOMATICAL MEASURING DEVICE FOR PARALLEL TESTING HIGH-COMPLEXITY INTEGRATED CIRCUITS, IN PARTICULAR MEMORY CIRCUITS
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