AUTOMATICAL MEASURING DEVICE FOR PARALLEL TESTING HIGH-COMPLEXITY INTEGRATED CIRCUITS, IN PARTICULAR MEMORY CIRCUITS

Bibliographische Detailangaben

Hauptverfasser:	TOMAN,GYOERGY,HU, BEKE,LASZLO,HU, KERI,DANIEL,HU, SZARKA,ANDRAS,HU, SZEKELY,ISTVAN,HU, BARTOS,IMRE,HU, VENER,PETER,HU, SZENCZI,ARPAD,HU, FUELOEPY,ATTILA,HU, MIKOS,LASZLO,HU, TAKACS,FERENC,HU, DEKANY,BELA,HU
Format:	Patent
Sprache:	eng
Schlagworte:	CALCULATING COMPUTING COUNTING DIGITAL COMPUTERS IN WHICH ALL THE COMPUTATION IS EFFECTEDMECHANICALLY ELECTRIC DIGITAL DATA PROCESSING MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
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