METHOD FOR DETERMINING THE CHARGED ENERGY STATES OF SEMICONDUCTORS AND INSULATORS BY TRANSIENT SPETROSCOPY OF DEEP EQUIPOTENTIAL SURFACES AND DEVICE FOR CARRYING OUT THE METHOD

Bibliographische Detailangaben

Hauptverfasser:	FERENCZI,GYOERGY,HU, HORVATH,PETER,HU, TOTH,FERENC,HU, BENKOVICS,LASZLO,HU, BODA,JANOS,HU, DOZSA,LASZLO,HU
Format:	Patent
Sprache:	eng
Schlagworte:	BASIC ELECTRIC ELEMENTS ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS SEMICONDUCTOR DEVICES TESTING
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