Apparatus and method
A method of operating a sensing element to sense a parameter, the sensing element comprising a sense TFT having a gate connection connected to a sensing electrode. the method comprising: providing a reference current (Ibias) through the sense TFT: providing a reference voltage (Vbias) at the gate co...
Gespeichert in:
| Hauptverfasser: | , |
|---|---|
| Format: | Patent |
| Sprache: | eng |
| Schlagworte: | |
| Online-Zugang: | Volltext bestellen |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| container_end_page | |
|---|---|
| container_issue | |
| container_start_page | |
| container_title | |
| container_volume | |
| creator | Henricus Derckx Wilhelmus Van Lier |
| description | A method of operating a sensing element to sense a parameter, the sensing element comprising a sense TFT having a gate connection connected to a sensing electrode. the method comprising: providing a reference current (Ibias) through the sense TFT: providing a reference voltage (Vbias) at the gate connection to obtain a reference sample voltage (Vcap) from a source connection of the sense TFT: providing, at the gate connection, an indicator voltage (Vgate) dependent upon the parameter to be sensed whilst the reference current (Ibias) continues to be provided through the sense TFT to obtain a sensing voltage from the source connection of the sense TFT; and sensing the parameter based on the difference between the sensing voltage (VS) and the reference sample voltage (Vcap). |
| format | Patent |
| fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_GB2608415B</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>GB2608415B</sourcerecordid><originalsourceid>FETCH-epo_espacenet_GB2608415B3</originalsourceid><addsrcrecordid>eNrjZBBxLChILEosKS1WSMxLUchNLcnIT-FhYE1LzClO5YXS3Azybq4hzh66qQX58anFBYnJqXmpJfHuTkZmBhYmhqZOxoRVAADD4B_C</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Apparatus and method</title><source>esp@cenet</source><creator>Henricus Derckx ; Wilhelmus Van Lier</creator><creatorcontrib>Henricus Derckx ; Wilhelmus Van Lier</creatorcontrib><description>A method of operating a sensing element to sense a parameter, the sensing element comprising a sense TFT having a gate connection connected to a sensing electrode. the method comprising: providing a reference current (Ibias) through the sense TFT: providing a reference voltage (Vbias) at the gate connection to obtain a reference sample voltage (Vcap) from a source connection of the sense TFT: providing, at the gate connection, an indicator voltage (Vgate) dependent upon the parameter to be sensed whilst the reference current (Ibias) continues to be provided through the sense TFT to obtain a sensing voltage from the source connection of the sense TFT; and sensing the parameter based on the difference between the sensing voltage (VS) and the reference sample voltage (Vcap).</description><language>eng</language><subject>ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS ; CALCULATING ; COMPUTING ; COUNTING ; ELECTRIC DIGITAL DATA PROCESSING ; MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE ; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR ; PHYSICS ; TARIFF METERING APPARATUS ; TESTING</subject><creationdate>2023</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20231004&DB=EPODOC&CC=GB&NR=2608415B$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25563,76318</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20231004&DB=EPODOC&CC=GB&NR=2608415B$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Henricus Derckx</creatorcontrib><creatorcontrib>Wilhelmus Van Lier</creatorcontrib><title>Apparatus and method</title><description>A method of operating a sensing element to sense a parameter, the sensing element comprising a sense TFT having a gate connection connected to a sensing electrode. the method comprising: providing a reference current (Ibias) through the sense TFT: providing a reference voltage (Vbias) at the gate connection to obtain a reference sample voltage (Vcap) from a source connection of the sense TFT: providing, at the gate connection, an indicator voltage (Vgate) dependent upon the parameter to be sensed whilst the reference current (Ibias) continues to be provided through the sense TFT to obtain a sensing voltage from the source connection of the sense TFT; and sensing the parameter based on the difference between the sensing voltage (VS) and the reference sample voltage (Vcap).</description><subject>ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS</subject><subject>CALCULATING</subject><subject>COMPUTING</subject><subject>COUNTING</subject><subject>ELECTRIC DIGITAL DATA PROCESSING</subject><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE</subject><subject>MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR</subject><subject>PHYSICS</subject><subject>TARIFF METERING APPARATUS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2023</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZBBxLChILEosKS1WSMxLUchNLcnIT-FhYE1LzClO5YXS3Azybq4hzh66qQX58anFBYnJqXmpJfHuTkZmBhYmhqZOxoRVAADD4B_C</recordid><startdate>20231004</startdate><enddate>20231004</enddate><creator>Henricus Derckx</creator><creator>Wilhelmus Van Lier</creator><scope>EVB</scope></search><sort><creationdate>20231004</creationdate><title>Apparatus and method</title><author>Henricus Derckx ; Wilhelmus Van Lier</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_GB2608415B3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2023</creationdate><topic>ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS</topic><topic>CALCULATING</topic><topic>COMPUTING</topic><topic>COUNTING</topic><topic>ELECTRIC DIGITAL DATA PROCESSING</topic><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE</topic><topic>MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR</topic><topic>PHYSICS</topic><topic>TARIFF METERING APPARATUS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>Henricus Derckx</creatorcontrib><creatorcontrib>Wilhelmus Van Lier</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Henricus Derckx</au><au>Wilhelmus Van Lier</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Apparatus and method</title><date>2023-10-04</date><risdate>2023</risdate><abstract>A method of operating a sensing element to sense a parameter, the sensing element comprising a sense TFT having a gate connection connected to a sensing electrode. the method comprising: providing a reference current (Ibias) through the sense TFT: providing a reference voltage (Vbias) at the gate connection to obtain a reference sample voltage (Vcap) from a source connection of the sense TFT: providing, at the gate connection, an indicator voltage (Vgate) dependent upon the parameter to be sensed whilst the reference current (Ibias) continues to be provided through the sense TFT to obtain a sensing voltage from the source connection of the sense TFT; and sensing the parameter based on the difference between the sensing voltage (VS) and the reference sample voltage (Vcap).</abstract><oa>free_for_read</oa></addata></record> |
| fulltext | fulltext_linktorsrc |
| identifier | |
| ispartof | |
| issn | |
| language | eng |
| recordid | cdi_epo_espacenet_GB2608415B |
| source | esp@cenet |
| subjects | ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR PHYSICS TARIFF METERING APPARATUS TESTING |
| title | Apparatus and method |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-13T01%3A56%3A23IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=Henricus%20Derckx&rft.date=2023-10-04&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EGB2608415B%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |