Apparatus and method

A method of operating a sensing element to sense a parameter, the sensing element comprising a sense TFT having a gate connection connected to a sensing electrode. the method comprising: providing a reference current (Ibias) through the sense TFT: providing a reference voltage (Vbias) at the gate co...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser:	Henricus Derckx, Wilhelmus Van Lier
Format:	Patent
Sprache:	eng
Schlagworte:	ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR PHYSICS TARIFF METERING APPARATUS TESTING
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Beschreibung
Zusammenfassung:	A method of operating a sensing element to sense a parameter, the sensing element comprising a sense TFT having a gate connection connected to a sensing electrode. the method comprising: providing a reference current (Ibias) through the sense TFT: providing a reference voltage (Vbias) at the gate connection to obtain a reference sample voltage (Vcap) from a source connection of the sense TFT: providing, at the gate connection, an indicator voltage (Vgate) dependent upon the parameter to be sensed whilst the reference current (Ibias) continues to be provided through the sense TFT to obtain a sensing voltage from the source connection of the sense TFT; and sensing the parameter based on the difference between the sensing voltage (VS) and the reference sample voltage (Vcap).