Measuring device and method
A device 110 for measuring the characteristics of an impact pattern (131, Fig.1c) on a surface 130 impacted by an object such as a missile or projectile. The device 110 has a lighting unit (111, Fig.1a) and an angle measurement unit (112, Fig.1a). The lighting unit (111, Fig.1a) has a face portion (...
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creator | Richard Livesey Matthew Geoffrey Swan |
description | A device 110 for measuring the characteristics of an impact pattern (131, Fig.1c) on a surface 130 impacted by an object such as a missile or projectile. The device 110 has a lighting unit (111, Fig.1a) and an angle measurement unit (112, Fig.1a). The lighting unit (111, Fig.1a) has a face portion (113, Fig.1a) and a light source (474, Fig.4a). The face portion 113 includes two or more lighting regions (114, 115, Fig.1b) arranged to project light about a common longitudinal axis 150 extending perpendicular from the face portion 113. Each lighting region (114, 115, Fig.1b) has a circular boundary (116, 117, Fig.1b). The diameter of the circular boundary (116, 117, Fig.1b) is adjustable. Lighting regions (114, 115, Fig.1b) are concentrically arranged. The angle measurement unit (112, Fig.1a) is arranged to measure an angle 151 between the surface 130 and the longitudinal axis 150. A corresponding method is disclosed which utilises the device to measure an angle of impact of an object on the surface. The method involves adjusting the diameter circular boundaries (116, 117, Fig.1b) of the projected light patterns and aligning the boundaries with impact pattern features (131, Fig.1c) on a surface 130. |
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fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_GB2584797A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>GB2584797A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_GB2584797A3</originalsourceid><addsrcrecordid>eNrjZJD2TU0sLi3KzEtXSEkty0xOVUjMS1HITS3JyE_hYWBNS8wpTuWF0twM8m6uIc4euqkF-fGpxQWJyal5qSXx7k5GphYm5pbmjsaEVQAA3uYicQ</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Measuring device and method</title><source>esp@cenet</source><creator>Richard Livesey ; Matthew Geoffrey Swan</creator><creatorcontrib>Richard Livesey ; Matthew Geoffrey Swan</creatorcontrib><description>A device 110 for measuring the characteristics of an impact pattern (131, Fig.1c) on a surface 130 impacted by an object such as a missile or projectile. The device 110 has a lighting unit (111, Fig.1a) and an angle measurement unit (112, Fig.1a). The lighting unit (111, Fig.1a) has a face portion (113, Fig.1a) and a light source (474, Fig.4a). The face portion 113 includes two or more lighting regions (114, 115, Fig.1b) arranged to project light about a common longitudinal axis 150 extending perpendicular from the face portion 113. Each lighting region (114, 115, Fig.1b) has a circular boundary (116, 117, Fig.1b). The diameter of the circular boundary (116, 117, Fig.1b) is adjustable. Lighting regions (114, 115, Fig.1b) are concentrically arranged. The angle measurement unit (112, Fig.1a) is arranged to measure an angle 151 between the surface 130 and the longitudinal axis 150. A corresponding method is disclosed which utilises the device to measure an angle of impact of an object on the surface. The method involves adjusting the diameter circular boundaries (116, 117, Fig.1b) of the projected light patterns and aligning the boundaries with impact pattern features (131, Fig.1c) on a surface 130.</description><language>eng</language><subject>MEASURING ; MEASURING ANGLES ; MEASURING AREAS ; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS ; MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS ; PHYSICS ; TESTING ; TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES ; TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR</subject><creationdate>2020</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20201216&DB=EPODOC&CC=GB&NR=2584797A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76290</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20201216&DB=EPODOC&CC=GB&NR=2584797A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Richard Livesey</creatorcontrib><creatorcontrib>Matthew Geoffrey Swan</creatorcontrib><title>Measuring device and method</title><description>A device 110 for measuring the characteristics of an impact pattern (131, Fig.1c) on a surface 130 impacted by an object such as a missile or projectile. The device 110 has a lighting unit (111, Fig.1a) and an angle measurement unit (112, Fig.1a). The lighting unit (111, Fig.1a) has a face portion (113, Fig.1a) and a light source (474, Fig.4a). The face portion 113 includes two or more lighting regions (114, 115, Fig.1b) arranged to project light about a common longitudinal axis 150 extending perpendicular from the face portion 113. Each lighting region (114, 115, Fig.1b) has a circular boundary (116, 117, Fig.1b). The diameter of the circular boundary (116, 117, Fig.1b) is adjustable. Lighting regions (114, 115, Fig.1b) are concentrically arranged. The angle measurement unit (112, Fig.1a) is arranged to measure an angle 151 between the surface 130 and the longitudinal axis 150. A corresponding method is disclosed which utilises the device to measure an angle of impact of an object on the surface. The method involves adjusting the diameter circular boundaries (116, 117, Fig.1b) of the projected light patterns and aligning the boundaries with impact pattern features (131, Fig.1c) on a surface 130.</description><subject>MEASURING</subject><subject>MEASURING ANGLES</subject><subject>MEASURING AREAS</subject><subject>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</subject><subject>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</subject><subject>PHYSICS</subject><subject>TESTING</subject><subject>TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES</subject><subject>TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2020</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZJD2TU0sLi3KzEtXSEkty0xOVUjMS1HITS3JyE_hYWBNS8wpTuWF0twM8m6uIc4euqkF-fGpxQWJyal5qSXx7k5GphYm5pbmjsaEVQAA3uYicQ</recordid><startdate>20201216</startdate><enddate>20201216</enddate><creator>Richard Livesey</creator><creator>Matthew Geoffrey Swan</creator><scope>EVB</scope></search><sort><creationdate>20201216</creationdate><title>Measuring device and method</title><author>Richard Livesey ; Matthew Geoffrey Swan</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_GB2584797A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2020</creationdate><topic>MEASURING</topic><topic>MEASURING ANGLES</topic><topic>MEASURING AREAS</topic><topic>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</topic><topic>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</topic><topic>PHYSICS</topic><topic>TESTING</topic><topic>TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES</topic><topic>TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR</topic><toplevel>online_resources</toplevel><creatorcontrib>Richard Livesey</creatorcontrib><creatorcontrib>Matthew Geoffrey Swan</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Richard Livesey</au><au>Matthew Geoffrey Swan</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Measuring device and method</title><date>2020-12-16</date><risdate>2020</risdate><abstract>A device 110 for measuring the characteristics of an impact pattern (131, Fig.1c) on a surface 130 impacted by an object such as a missile or projectile. The device 110 has a lighting unit (111, Fig.1a) and an angle measurement unit (112, Fig.1a). The lighting unit (111, Fig.1a) has a face portion (113, Fig.1a) and a light source (474, Fig.4a). The face portion 113 includes two or more lighting regions (114, 115, Fig.1b) arranged to project light about a common longitudinal axis 150 extending perpendicular from the face portion 113. Each lighting region (114, 115, Fig.1b) has a circular boundary (116, 117, Fig.1b). The diameter of the circular boundary (116, 117, Fig.1b) is adjustable. Lighting regions (114, 115, Fig.1b) are concentrically arranged. The angle measurement unit (112, Fig.1a) is arranged to measure an angle 151 between the surface 130 and the longitudinal axis 150. A corresponding method is disclosed which utilises the device to measure an angle of impact of an object on the surface. The method involves adjusting the diameter circular boundaries (116, 117, Fig.1b) of the projected light patterns and aligning the boundaries with impact pattern features (131, Fig.1c) on a surface 130.</abstract><oa>free_for_read</oa></addata></record> |
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subjects | MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS TESTING TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR |
title | Measuring device and method |
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