Measuring device and method

A device 110 for measuring the characteristics of an impact pattern (131, Fig.1c) on a surface 130 impacted by an object such as a missile or projectile. The device 110 has a lighting unit (111, Fig.1a) and an angle measurement unit (112, Fig.1a). The lighting unit (111, Fig.1a) has a face portion (...

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Bibliographische Detailangaben
Hauptverfasser: Richard Livesey, Matthew Geoffrey Swan
Format: Patent
Sprache:eng
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Beschreibung
Zusammenfassung:A device 110 for measuring the characteristics of an impact pattern (131, Fig.1c) on a surface 130 impacted by an object such as a missile or projectile. The device 110 has a lighting unit (111, Fig.1a) and an angle measurement unit (112, Fig.1a). The lighting unit (111, Fig.1a) has a face portion (113, Fig.1a) and a light source (474, Fig.4a). The face portion 113 includes two or more lighting regions (114, 115, Fig.1b) arranged to project light about a common longitudinal axis 150 extending perpendicular from the face portion 113. Each lighting region (114, 115, Fig.1b) has a circular boundary (116, 117, Fig.1b). The diameter of the circular boundary (116, 117, Fig.1b) is adjustable. Lighting regions (114, 115, Fig.1b) are concentrically arranged. The angle measurement unit (112, Fig.1a) is arranged to measure an angle 151 between the surface 130 and the longitudinal axis 150. A corresponding method is disclosed which utilises the device to measure an angle of impact of an object on the surface. The method involves adjusting the diameter circular boundaries (116, 117, Fig.1b) of the projected light patterns and aligning the boundaries with impact pattern features (131, Fig.1c) on a surface 130.