Generating a high-resolution lithology model for subsurface formation evaluation

Examples of techniques for generating a high-resolution lithology model for subsurface formation evaluation are disclosed. In one example implementation according to aspects of the present disclosure, a computer-implemented method includes determining, by a processing device, a low-resolution lithol...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: Hao Zhang, Alberto Mezzatesta
Format: Patent
Sprache:eng
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Beschreibung
Zusammenfassung:Examples of techniques for generating a high-resolution lithology model for subsurface formation evaluation are disclosed. In one example implementation according to aspects of the present disclosure, a computer-implemented method includes determining, by a processing device, a low-resolution lithology volumetric model. The method further includes comparing, by the processing device, the low-resolution lithology volumetric model to a high-resolution imaging log. The method further includes calculating, by the processing device, a dynamic boundary curve for each of a plurality of moving windows. The method further includes generating, by the processing device, the high-resolution lithology model based at least in part on the calculated dynamic boundary curve for each of the plurality of moving windows. The method further includes controlling a drilling operation based at least in part on the high-resolution lithology model.