Position detection system and method of detecting a movement of a machine
A position detection system for detecting a movement of a machine includes a first and a second position sensor and an evaluation device. The first position sensor is configured to detect a change in a first magnetic field generated by the movement of the machine. The second position sensor is confi...
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Format: | Patent |
Sprache: | eng |
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Zusammenfassung: | A position detection system for detecting a movement of a machine includes a first and a second position sensor and an evaluation device. The first position sensor is configured to detect a change in a first magnetic field generated by the movement of the machine. The second position sensor is configured to detect a change in a second magnetic field, which differs from the first magnetic field and is generated by the movement of the machine. A detection result from the second position sensor has a lower resolution of a position of an element of the machine to be determined than a detection result from the first position sensor. The evaluation device is configured to evaluate the detection result from the first position sensor and/or the detection result from the second position sensor to determine the position of the element of the machine. |
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