Improved method, apparatus and system for estimating the mass of a stockpile

The invention resides in a method or system configured to estimate the mass of material in a stockpile. The surface profile of the stockpile is obtained and a plurality of layers are defined in the stockpile. Each layer extends parallel to the surface profile. Density characteristics of the stockpil...

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Bibliographische Detailangaben
1. Verfasser:	Sergei Fedorenko
Format:	Patent
Sprache:	eng
Schlagworte:	CALCULATING COMPUTING COUNTING DATA PROCESSING SYSTEMS OR METHODS, SPECIALLY ADAPTED FORADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORYOR FORECASTING PURPOSES IMAGE DATA PROCESSING OR GENERATION, IN GENERAL INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS MEASURING VOLUME, VOLUME FLOW, MASS FLOW OR LIQUIDLEVEL METERING BY VOLUME PHYSICS SYSTEMS OR METHODS SPECIALLY ADAPTED FOR ADMINISTRATIVE,COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORY OR FORECASTINGPURPOSES, NOT OTHERWISE PROVIDED FOR TESTING WEIGHING
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Beschreibung
Zusammenfassung:	The invention resides in a method or system configured to estimate the mass of material in a stockpile. The surface profile of the stockpile is obtained and a plurality of layers are defined in the stockpile. Each layer extends parallel to the surface profile. Density characteristics of the stockpile material are obtained, from database records or measurement tests. The volume of each layer is estimated. The density of each layer is estimated, according to the density characteristics of the stockpile material. Using the volume of each layer and the density of each layer the mass of the stockpile is calculated.