Temperature determination based on emissivity

An additive manufacturing system may include a controller to determine an emissivity of a portion of a layer of build material based on a measured optical property of the portion, or based on object design data representing a degree of intended solidification of the portion. The controller may be to...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
1. Verfasser: David H. Donovan
Format: Patent
Sprache:eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:An additive manufacturing system may include a controller to determine an emissivity of a portion of a layer of build material based on a measured optical property of the portion, or based on object design data representing a degree of intended solidification of the portion. The controller may be to determine a temperature of the portion based on the determined emissivity and a measured radiation distribution emitted by the portion.