Atomic layer deposition

A method of depositing a material on a substrate using an atomic layer deposition process, wherein the deposition process comprises a first deposition step, a second deposition step subsequent to the first deposition step, and a delay of at least one minute between the first deposition step and the...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: Charles Anthony Nield Collis, Nathan Charles Brown, Sai Giridhar Shivareddy, Gehan Anjil Joseph Amaratunga, Youngjin Choi
Format: Patent
Sprache:eng
Schlagworte:
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Beschreibung
Zusammenfassung:A method of depositing a material on a substrate using an atomic layer deposition process, wherein the deposition process comprises a first deposition step, a second deposition step subsequent to the first deposition step, and a delay of at least one minute between the first deposition step and the second deposition step. Each deposition step comprises a plurality of deposition cycles. The delay is introduced to the deposition process by prolonging a period of time for which a purge gas is supplied to a process chamber housing the substrate at the end of a selected one of the deposition cycles.