Wafer-type venturi cone meter

Provided is a wafer-type Venturi cone meter, the assemblability and reliability of flow metering of which is improved, and in which noise and vibrations may be reduced. The wafer-type Venturi cone meter according to the present invention includes a flow meter body installed at the middle portion of a pipe such that a fluid may flow, a Venturi cone inserted into the flow meter body, a wing member radially extending from the end of one side of the Venturi cone, and a tube-shaped flange member to which the end of the other side of the wing member is fixed, the flange member being detachably inserted into an inner surface of the flow meter body and fixed to the flow meter body. Thus, assemblability of the wafer-type Venturi cone meter may be improved, and the wafer-type Venturi cone meter may be firmly fixed to reduce noise and vibrations. Also, since the flow of the fluid is not interrupted, the reliability of the flow metering may be improved.