Predicted fault analysis

Methods, apparatuses and systems to correlate candidate factors such as process variables or parameters to a predicted fault in a process control system. The method includes steps of obtaining a value associated with a particular factor corresponding to a process, and predicting a fault based on the...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: Ling Zhou, Terrence Lynn Blevins, Christopher J Worek, Paul Richard Muston, Robert B Havekost, Mark John Nixon, Paul Kenneth Daly, Wilhelm K Wojsznis
Format: Patent
Sprache:eng
Schlagworte:
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Beschreibung
Zusammenfassung:Methods, apparatuses and systems to correlate candidate factors such as process variables or parameters to a predicted fault in a process control system. The method includes steps of obtaining a value associated with a particular factor corresponding to a process, and predicting a fault based on the value. A set of candidate factors corresponding to the predicted fault may be determined, and a correlation between the predicted fault and at least one factor from the set be displayed. Different sections of the display may respectively correspond to the predicted fault and to the at least one factor, and the correlation may be indicated by time aligning the different sections. Modifications to one displayed section may result in automatic modification of other sections to maintain the correlation. A user may select one or more candidate factors to be displayed, and may indicate a particular point of a particular section to obtain additional details.