Method and apparatus for surface processing of a substrate using an energetic particle beam
Method and apparatus for processing a substrate (44) with an energetic particle beam (42). Features (66) on the substrate (44) are oriented relative to the energetic particle beam (42) and the substrate (44) is scanned through the energetic particle beam (42). The substrate (44) is periodically inde...
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Format: | Patent |
Sprache: | eng |
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Zusammenfassung: | Method and apparatus for processing a substrate (44) with an energetic particle beam (42). Features (66) on the substrate (44) are oriented relative to the energetic particle beam (42) and the substrate (44) is scanned through the energetic particle beam (42). The substrate (44) is periodically indexed about its azimuthal axis (45) of symmetry, while shielded from exposure to the energetic particle beam (42), to reorient the features (66) relative to the major dimension (49) of the beam (42). |
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