PROCEDE DE DETECTION D'UNE ATTEINTE A L'INTEGRITE D'UN SUBSTRAT SEMI-CONDUCTEUR D'UN CIRCUIT INTEGRE DEPUIS SA FACE ARRIERE, ET DISPOSITIF CORRESPONDANT

A semiconductor substrate of an integrated circuit is protected by a coating. The semiconductor includes a front face and a rear face. To detect a breach of the integrity of a semiconductor substrate of an integrated circuit from the rear face, an opening of the coating facing the rear face of the s...

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Hauptverfasser:	FRONTE, DANIELE, SARAFIANOS, ALEXANDRE, NICOLAS, BRUNO
Format:	Patent
Sprache:	fre
Schlagworte:	BASIC ELECTRIC ELEMENTS CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY PHYSICS SEMICONDUCTOR DEVICES
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