ELEMENT DE DETECTION QUANTIQUE A FAIBLE BRUIT ET PROCEDE DE FABRICATION D'UN TEL ELEMENT DE PHOTODETECTION

According to one aspect, the invention relates to an element for quantum photodetection of an incident radiation in a spectral band centered around a central wavelength λ0, having a front surface intended for receiving said radiation, and including: a stack of layers of semiconductor material formin...

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Bibliographische Detailangaben
Hauptverfasser: PORTIER, BENJAMIN, PELOUARD, JEAN-LUC, HAIDAR, RIAD, VERDUN, MICHAEL, PARDO, FABRICE
Format: Patent
Sprache:fre
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Beschreibung
Zusammenfassung:According to one aspect, the invention relates to an element for quantum photodetection of an incident radiation in a spectral band centered around a central wavelength λ0, having a front surface intended for receiving said radiation, and including: a stack of layers of semiconductor material forming a PN or PIN junction and including at least one layer made of an absorbent semiconductor material having a cut-off wavelength λ0>λ0, the stack of layers of semiconductor material forming a resonant optical cavity; and a structure for coupling the incident radiation with the optical cavity such as to form a resonance at the central wavelength λ0 allowing the absorption of more than 80% in the layer of absorbent semiconductor material at said central wavelength, and an absence of resonance at the radiative wavelength λrad, wherein the radiative wavelength λrad is the wavelength for which, at operating temperature, the radiative recombination rate is the highest.