PROCEDE DE DETERMINATION DE L'ETAT DE DECAPAGE D'UNE SURFACE METALLIQUE

The invention concerns a method for determining the etching state of an etched metal surface comprising the following steps: - determining a luminance parameter (La*, Lb*, Lc*, Ld*) and a chrominance parameter (ba*, bb*, bc*, bd*) for each of a plurality of standard samples (a, b, c, d) correspondin...

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Bibliographische Detailangaben
Hauptverfasser:	SAMUEL JOAN, PREZEAU TONY, LEGER GUILLAUME
Format:	Patent
Sprache:	fre
Schlagworte:	COLORIMETRY INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT MEASURING PHYSICS RADIATION PYROMETRY TESTING
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Beschreibung
Zusammenfassung:	The invention concerns a method for determining the etching state of an etched metal surface comprising the following steps: - determining a luminance parameter (La, Lb, Lc, Ld) and a chrominance parameter (ba, bb, bc, bd) for each of a plurality of standard samples (a, b, c, d) corresponding respectively to a plurality of degrees of etching (Sa1, Sa2, Sa2,5, Sa3); - determining a luminance parameter (Lx) and a chrominance parameter (bx) of the etched metal surface; and - determining a degree of etching (Sa1, Sa2, Sa2,5, Sa3) of the etched metal surface on the basis of a comparison of the luminance parameter (Lx) and chrominance parameter (bx) of the etched metal surface with the luminance parameter (La, Lb, Lc, Ld) and chrominance parameter (ba, bb, bc, bd) of the plurality of standard samples (a, b, c, d).