TAMPON DE POLISSAGE BIAISE RADIALEMENT ET PROCEDE DE POLISSAGE L'UTILISANT
A polishing layer (140) has an annular polishing track (125) concentric with rotational center (102). The radial micro-channels are formed in the polishing layer within width (133) of the annular polishing track and a majority of the micro channels have a radial orientation and an average width less...
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creator | MULDOWNEY GREGORY P |
description | A polishing layer (140) has an annular polishing track (125) concentric with rotational center (102). The radial micro-channels are formed in the polishing layer within width (133) of the annular polishing track and a majority of the micro channels have a radial orientation and an average width less than 50mu m. An independent claim is included for substrate polishing method. |
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fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_FR2884164B1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>FR2884164B1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_FR2884164B13</originalsourceid><addsrcrecordid>eNrjZPAKcfQN8PdTcHFVCPD38QwOdnR3VXDydPQMdlUIcnTxdPRx9XX1C1FwDVEICPJ3dgWqQ1Hqox4a4gnkOPqF8DCwpiXmFKfyQmluBgU31xBnD93Ugvz41OKCxOTUvNSSeLcgIwsLE0MzEydDYyKUAADmLSzQ</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>TAMPON DE POLISSAGE BIAISE RADIALEMENT ET PROCEDE DE POLISSAGE L'UTILISANT</title><source>esp@cenet</source><creator>MULDOWNEY GREGORY P</creator><creatorcontrib>MULDOWNEY GREGORY P</creatorcontrib><description>A polishing layer (140) has an annular polishing track (125) concentric with rotational center (102). The radial micro-channels are formed in the polishing layer within width (133) of the annular polishing track and a majority of the micro channels have a radial orientation and an average width less than 50mu m. An independent claim is included for substrate polishing method.</description><language>fre</language><subject>DRESSING OR CONDITIONING OF ABRADING SURFACES ; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS ; GRINDING ; MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING ; PERFORMING OPERATIONS ; POLISHING ; TOOLS FOR GRINDING, BUFFING, OR SHARPENING ; TRANSPORTING</subject><creationdate>2014</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20140411&DB=EPODOC&CC=FR&NR=2884164B1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25563,76318</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20140411&DB=EPODOC&CC=FR&NR=2884164B1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>MULDOWNEY GREGORY P</creatorcontrib><title>TAMPON DE POLISSAGE BIAISE RADIALEMENT ET PROCEDE DE POLISSAGE L'UTILISANT</title><description>A polishing layer (140) has an annular polishing track (125) concentric with rotational center (102). The radial micro-channels are formed in the polishing layer within width (133) of the annular polishing track and a majority of the micro channels have a radial orientation and an average width less than 50mu m. An independent claim is included for substrate polishing method.</description><subject>DRESSING OR CONDITIONING OF ABRADING SURFACES</subject><subject>FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS</subject><subject>GRINDING</subject><subject>MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING</subject><subject>PERFORMING OPERATIONS</subject><subject>POLISHING</subject><subject>TOOLS FOR GRINDING, BUFFING, OR SHARPENING</subject><subject>TRANSPORTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2014</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZPAKcfQN8PdTcHFVCPD38QwOdnR3VXDydPQMdlUIcnTxdPRx9XX1C1FwDVEICPJ3dgWqQ1Hqox4a4gnkOPqF8DCwpiXmFKfyQmluBgU31xBnD93Ugvz41OKCxOTUvNSSeLcgIwsLE0MzEydDYyKUAADmLSzQ</recordid><startdate>20140411</startdate><enddate>20140411</enddate><creator>MULDOWNEY GREGORY P</creator><scope>EVB</scope></search><sort><creationdate>20140411</creationdate><title>TAMPON DE POLISSAGE BIAISE RADIALEMENT ET PROCEDE DE POLISSAGE L'UTILISANT</title><author>MULDOWNEY GREGORY P</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_FR2884164B13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>fre</language><creationdate>2014</creationdate><topic>DRESSING OR CONDITIONING OF ABRADING SURFACES</topic><topic>FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS</topic><topic>GRINDING</topic><topic>MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING</topic><topic>PERFORMING OPERATIONS</topic><topic>POLISHING</topic><topic>TOOLS FOR GRINDING, BUFFING, OR SHARPENING</topic><topic>TRANSPORTING</topic><toplevel>online_resources</toplevel><creatorcontrib>MULDOWNEY GREGORY P</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>MULDOWNEY GREGORY P</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>TAMPON DE POLISSAGE BIAISE RADIALEMENT ET PROCEDE DE POLISSAGE L'UTILISANT</title><date>2014-04-11</date><risdate>2014</risdate><abstract>A polishing layer (140) has an annular polishing track (125) concentric with rotational center (102). The radial micro-channels are formed in the polishing layer within width (133) of the annular polishing track and a majority of the micro channels have a radial orientation and an average width less than 50mu m. An independent claim is included for substrate polishing method.</abstract><oa>free_for_read</oa></addata></record> |
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subjects | DRESSING OR CONDITIONING OF ABRADING SURFACES FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS GRINDING MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING PERFORMING OPERATIONS POLISHING TOOLS FOR GRINDING, BUFFING, OR SHARPENING TRANSPORTING |
title | TAMPON DE POLISSAGE BIAISE RADIALEMENT ET PROCEDE DE POLISSAGE L'UTILISANT |
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