Electronic integrated circuit e.g. silicon on insulator type circuit, testing structure, has channel guiding photons to front side of circuit and comprising metallizing rings stack so that vias stop escape of photons from channel

The structure has a channel (80) provided between top of a commutation unit and a front side of an electronic integrated circuit. The channel guides photons towards the front side, where the photons are emitted by the commutation unit. The channel comprises a stack of metallizing rings (82-87) provi...

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Bibliographische Detailangaben

Hauptverfasser:	PARRASSIN THIERRY, DUDIT SYLVAIN, SARDIN PHILIPPE, VALLET MICHEL
Format:	Patent
Sprache:	eng ; fre
Schlagworte:	BASIC ELECTRIC ELEMENTS ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS OPTICS PHYSICS SEMICONDUCTOR DEVICES TESTING
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