RESEAU DE DIFFRACTION A EMPILEMENTS MULTICOUCHES ALTERNES ET SON PROCEDE DE FABRICATION ET DISPOSITIFS SPECTROSCOPIQUES COMPORTANT CES RESEAUX

RESEAU DE DIFFRACTION A EMPILEMENTS MULTICOUCHES ALTERNES ET SON PROCEDE DE FABRICATION ET DISPOSITIFS SPECTROSCOPIQUES COMPORTANT CES RESEAUX

The grating has a periodicity structure (4) carried by a surface (3) of a substrate (2). Two periodic thin layer stackings (5, 6) of periods d1 and d2, respectively, are constituted of layers of two different materials, where the stackings form parallel traces separated from the surface and spaced p...

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Bibliographische Detailangaben
Hauptverfasser: IDIR MOURAD, FOLACK FRANCOIS, JOURDAIN ERICK, LIARD CLOUP AUDREY
Format: Patent
Sprache:fre
Schlagworte:
COLORIMETRY
GAMMA RAY OR X-RAY MICROSCOPES
IRRADIATION DEVICES
MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT
MEASURING
NUCLEAR ENGINEERING
NUCLEAR PHYSICS
OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
OPTICS
PHYSICS
RADIATION PYROMETRY
TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOTOTHERWISE PROVIDED FOR
TESTING
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Beschreibung
Zusammenfassung:The grating has a periodicity structure (4) carried by a surface (3) of a substrate (2). Two periodic thin layer stackings (5, 6) of periods d1 and d2, respectively, are constituted of layers of two different materials, where the stackings form parallel traces separated from the surface and spaced periodically. The layers of the two stackings are placed alternative to each other. Independent claims are also included for the following: (A) a method of fabrication of a diffraction grating (B) a spectroscopic device for analyzing or filtering a light source comprising a diffraction grating.