Optical fiber thickness measurement method for use in quality control by placing the fiber so that it blocks an electron beam incident on a CRT and using beam deviation to measure thickness

Optical fiber thickness measurement method for use in quality control by placing the fiber so that it blocks an electron beam incident on a CRT and using beam deviation to measure thickness

Method for rapid measurement of the thickness of an optical fiber (5), in which the fiber is scanned using a light beam, so that the thickness of the fiber is determined from the area hidden by the fiber as it is scanned over. To scan over the area a point light source is moved over the light fiber...

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Hauptverfasser: ROLLAND DIDIER, FLOCH BERNARD, KOSMALSKI STEPHANE
Format: Patent
Sprache:eng ; fre
Schlagworte:
MEASURING
MEASURING ANGLES
MEASURING AREAS
MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS
PHYSICS
TESTING
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creator ROLLAND DIDIER
FLOCH BERNARD
KOSMALSKI STEPHANE
description Method for rapid measurement of the thickness of an optical fiber (5), in which the fiber is scanned using a light beam, so that the thickness of the fiber is determined from the area hidden by the fiber as it is scanned over. To scan over the area a point light source is moved over the light fiber on a scanning trajectory (S) that covers the fiber or other object. An Independent claim is made for a device for determining the thickness of an optical fiber L'invention concerne un procédé de mesure rapide de l'épaisseur d'un objet (5) consistant à balayer une région contenant ledit objet à l'aide d'un faisceau lumineux, à détecter, pendant le balayage, lorsque le faisceau lumineux traverse la région et lorsqu'il est occulté par l'objet et à en déduire l'épaisseur de l'objet.Ce procédé est caractérisé en ce que l'on réalise le balayage de ladite région en déplaçant une source lumineuse ponctuelle au voisinage de l'objet à mesurer, sur une trajectoire de balayage (S) couvrant sensiblement l'épaisseur dudit objet.L'invention concerne également un appareil pour mettre en oeuvre ce procédé.
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subjects MEASURING
MEASURING ANGLES
MEASURING AREAS
MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS
PHYSICS
TESTING
title Optical fiber thickness measurement method for use in quality control by placing the fiber so that it blocks an electron beam incident on a CRT and using beam deviation to measure thickness
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