Installation for the measurement of components forming part of a circuit placed in an enclosure
An installation for the high temperature measurement of an element (1) contained in the cabinet (2) of a television set, of a microwave oven or other enclosure. The terminals (7, 8) of the element (1) leave (at 12 and 13) this enclosure (2). Means (24, 20, 38) are provided outside the enclosure (1)...
Gespeichert in:
| Hauptverfasser: | , |
|---|---|
| Format: | Patent |
| Sprache: | eng ; fre |
| Schlagworte: | |
| Online-Zugang: | Volltext bestellen |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| container_end_page | |
|---|---|
| container_issue | |
| container_start_page | |
| container_title | |
| container_volume | |
| creator | BUATOIS JEAN-YVES BOUILLOT JEAN-MICHEL |
| description | An installation for the high temperature measurement of an element (1) contained in the cabinet (2) of a television set, of a microwave oven or other enclosure. The terminals (7, 8) of the element (1) leave (at 12 and 13) this enclosure (2). Means (24, 20, 38) are provided outside the enclosure (1) for sequential switching so that, when the high temperature measurement is to be made, this element (1) is almost instantaneously isolated and connected to the terminals (30, 31) of a measuring apparatus (32).
Installation pour la mesure à chaud d'un élément (1) contenu dans l'enceinte (2) d'un téléviseur, d'un four à micro-ondes, ou autre. Les bornes (7, 8) de l'élément (1) sont sorties (en 12 et 13) de cette enceinte (2). Il est prévu des moyens de commutation séquencés (24, 20, 38), extérieurs à l'enceinte (1), pour, lorsque l'on désire faire la mesure à chaud, isoler quasi-instantanément cet élément (1) et le brancher aux bornes (30, 31) d'un appareil de mesure (32). |
| format | Patent |
| fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_FR2657435A1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>FR2657435A1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_FR2657435A13</originalsourceid><addsrcrecordid>eNqNjDEOwjAQBNNQIOAP-wEKCIE6QkTQInrrZM5gyb6zbOf_JIgHUK1GO7vLxtykVAqBqleB04z6ZkSmMmaOLBXqYDUmlQnKbEQvLyTK34pgfbajr0iBLD_hBSRgsUHni3WzcBQKb365ajBcHufrlpMaLmnaCFcz3PfH7nRou37X_qF8AB-8PKA</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Installation for the measurement of components forming part of a circuit placed in an enclosure</title><source>esp@cenet</source><creator>BUATOIS JEAN-YVES ; BOUILLOT JEAN-MICHEL</creator><creatorcontrib>BUATOIS JEAN-YVES ; BOUILLOT JEAN-MICHEL</creatorcontrib><description>An installation for the high temperature measurement of an element (1) contained in the cabinet (2) of a television set, of a microwave oven or other enclosure. The terminals (7, 8) of the element (1) leave (at 12 and 13) this enclosure (2). Means (24, 20, 38) are provided outside the enclosure (1) for sequential switching so that, when the high temperature measurement is to be made, this element (1) is almost instantaneously isolated and connected to the terminals (30, 31) of a measuring apparatus (32).
Installation pour la mesure à chaud d'un élément (1) contenu dans l'enceinte (2) d'un téléviseur, d'un four à micro-ondes, ou autre. Les bornes (7, 8) de l'élément (1) sont sorties (en 12 et 13) de cette enceinte (2). Il est prévu des moyens de commutation séquencés (24, 20, 38), extérieurs à l'enceinte (1), pour, lorsque l'on désire faire la mesure à chaud, isoler quasi-instantanément cet élément (1) et le brancher aux bornes (30, 31) d'un appareil de mesure (32).</description><language>eng ; fre</language><subject>MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; PHYSICS ; TESTING</subject><creationdate>1991</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=19910726&DB=EPODOC&CC=FR&NR=2657435A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76289</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=19910726&DB=EPODOC&CC=FR&NR=2657435A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>BUATOIS JEAN-YVES</creatorcontrib><creatorcontrib>BOUILLOT JEAN-MICHEL</creatorcontrib><title>Installation for the measurement of components forming part of a circuit placed in an enclosure</title><description>An installation for the high temperature measurement of an element (1) contained in the cabinet (2) of a television set, of a microwave oven or other enclosure. The terminals (7, 8) of the element (1) leave (at 12 and 13) this enclosure (2). Means (24, 20, 38) are provided outside the enclosure (1) for sequential switching so that, when the high temperature measurement is to be made, this element (1) is almost instantaneously isolated and connected to the terminals (30, 31) of a measuring apparatus (32).
Installation pour la mesure à chaud d'un élément (1) contenu dans l'enceinte (2) d'un téléviseur, d'un four à micro-ondes, ou autre. Les bornes (7, 8) de l'élément (1) sont sorties (en 12 et 13) de cette enceinte (2). Il est prévu des moyens de commutation séquencés (24, 20, 38), extérieurs à l'enceinte (1), pour, lorsque l'on désire faire la mesure à chaud, isoler quasi-instantanément cet élément (1) et le brancher aux bornes (30, 31) d'un appareil de mesure (32).</description><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>1991</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNjDEOwjAQBNNQIOAP-wEKCIE6QkTQInrrZM5gyb6zbOf_JIgHUK1GO7vLxtykVAqBqleB04z6ZkSmMmaOLBXqYDUmlQnKbEQvLyTK34pgfbajr0iBLD_hBSRgsUHni3WzcBQKb365ajBcHufrlpMaLmnaCFcz3PfH7nRou37X_qF8AB-8PKA</recordid><startdate>19910726</startdate><enddate>19910726</enddate><creator>BUATOIS JEAN-YVES</creator><creator>BOUILLOT JEAN-MICHEL</creator><scope>EVB</scope></search><sort><creationdate>19910726</creationdate><title>Installation for the measurement of components forming part of a circuit placed in an enclosure</title><author>BUATOIS JEAN-YVES ; BOUILLOT JEAN-MICHEL</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_FR2657435A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; fre</language><creationdate>1991</creationdate><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>BUATOIS JEAN-YVES</creatorcontrib><creatorcontrib>BOUILLOT JEAN-MICHEL</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>BUATOIS JEAN-YVES</au><au>BOUILLOT JEAN-MICHEL</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Installation for the measurement of components forming part of a circuit placed in an enclosure</title><date>1991-07-26</date><risdate>1991</risdate><abstract>An installation for the high temperature measurement of an element (1) contained in the cabinet (2) of a television set, of a microwave oven or other enclosure. The terminals (7, 8) of the element (1) leave (at 12 and 13) this enclosure (2). Means (24, 20, 38) are provided outside the enclosure (1) for sequential switching so that, when the high temperature measurement is to be made, this element (1) is almost instantaneously isolated and connected to the terminals (30, 31) of a measuring apparatus (32).
Installation pour la mesure à chaud d'un élément (1) contenu dans l'enceinte (2) d'un téléviseur, d'un four à micro-ondes, ou autre. Les bornes (7, 8) de l'élément (1) sont sorties (en 12 et 13) de cette enceinte (2). Il est prévu des moyens de commutation séquencés (24, 20, 38), extérieurs à l'enceinte (1), pour, lorsque l'on désire faire la mesure à chaud, isoler quasi-instantanément cet élément (1) et le brancher aux bornes (30, 31) d'un appareil de mesure (32).</abstract><oa>free_for_read</oa></addata></record> |
| fulltext | fulltext_linktorsrc |
| identifier | |
| ispartof | |
| issn | |
| language | eng ; fre |
| recordid | cdi_epo_espacenet_FR2657435A1 |
| source | esp@cenet |
| subjects | MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING |
| title | Installation for the measurement of components forming part of a circuit placed in an enclosure |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-11T07%3A14%3A32IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=BUATOIS%20JEAN-YVES&rft.date=1991-07-26&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EFR2657435A1%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |