DISPOSITIF ET METHODE DE MESURE DES DEFORMATIONS D'UN ECHANTILLON

Apparatus and method for measuring deformations of a sample, said deformations resulting in particular from the relaxation of the stresses to which the sample was subjected before measurement, the sample having an axis corresponding to a principal deformation direction. This apparatus is characteris...

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Bibliographische Detailangaben
Hauptverfasser:	JACQUES LESSI, PHILIPPE PERREAU, GUY GRARD, DANIEL BARY
Format:	Patent
Sprache:	fre
Schlagworte:	MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS TESTING
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Beschreibung
Zusammenfassung:	Apparatus and method for measuring deformations of a sample, said deformations resulting in particular from the relaxation of the stresses to which the sample was subjected before measurement, the sample having an axis corresponding to a principal deformation direction. This apparatus is characterised in that it comprises at least five displacement sensors, each having a measurement direction, the measurement directions being essentially perpendicular to said axis of the sample.