CIRCUIT D'OUVERTURE RAPIDE POUR TRANSISTOR A EFFET DE CHAMP A MODULATION DE CONDUCTIVITE
UN CIRCUIT DE COMMUTATION RAPIDE A L'OUVERTURE DESTINE A UN TRANSISTOR A EFFET DE CHAMP A MODULATION DE CONDUCTIVITE, OU COMFET, Q1 EVITE LA CIRCULATION DE COURANTS DE VERROUILLAGE DESTRUCTEURS. UN COURANT DE COMMUTATION A L'OUVERTURE D'AMPLITUDE REDUITE EST APPLIQUE Q3 A L'ELECT...
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creator | HAROLD ROBERT RONAN JR ET CARL FRANKLIN WHEATLEY JR |
description | UN CIRCUIT DE COMMUTATION RAPIDE A L'OUVERTURE DESTINE A UN TRANSISTOR A EFFET DE CHAMP A MODULATION DE CONDUCTIVITE, OU COMFET, Q1 EVITE LA CIRCULATION DE COURANTS DE VERROUILLAGE DESTRUCTEURS. UN COURANT DE COMMUTATION A L'OUVERTURE D'AMPLITUDE REDUITE EST APPLIQUE Q3 A L'ELECTRODE DE GRILLE DU COMFET PENDANT LA PARTIE INITIALE DE LA COMMUTATION A L'OUVERTURE. LORSQUE LA TENSION SOURCE-DRAIN DU COMFET EST DEVENUE PLUS GRANDE QUE L'INTERVALLE DES BASSES TENSIONS SOURCE-DRAIN POUR LESQUELLES UN VERROUILLAGE PEUT SE PRODUIRE AVEC UN COURANT DE COMMUTATION A L'OUVERTURE D'AMPLITUDE ACCRUE, CE COURANT DE COMMUTATION A L'OUVERTURE D'AMPLITUDE ACCRUE EST APPLIQUE Q4 A L'ELECTRODE DE GRILLE DU COMFET.
A fast switch-off circuit for a conductivity modulated field effect transistor (COMFET) avoids the flow of destructive latch-up currents. A reduced-amplitude switch-off current is applied to the gate electrode of the COMFET during the initial portion of switch-off. When the source-to-drain voltage (VDS) of the COMFET has become larger than the range of low VDS voltage in which latch-up can occur for an increased-amplitude switch-off current being applied to the gate electrode of the COMFET, that increased-amplitude switch-off current is applied to the gate electrode of the COMFET. |
format | Patent |
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A fast switch-off circuit for a conductivity modulated field effect transistor (COMFET) avoids the flow of destructive latch-up currents. A reduced-amplitude switch-off current is applied to the gate electrode of the COMFET during the initial portion of switch-off. When the source-to-drain voltage (VDS) of the COMFET has become larger than the range of low VDS voltage in which latch-up can occur for an increased-amplitude switch-off current being applied to the gate electrode of the COMFET, that increased-amplitude switch-off current is applied to the gate electrode of the COMFET.</description><edition>4</edition><language>fre</language><subject>BASIC ELECTRONIC CIRCUITRY ; ELECTRICITY ; PULSE TECHNIQUE</subject><creationdate>1987</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=19871002&DB=EPODOC&CC=FR&NR=2596594A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76289</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=19871002&DB=EPODOC&CC=FR&NR=2596594A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>HAROLD ROBERT RONAN JR ET CARL FRANKLIN WHEATLEY JR</creatorcontrib><title>CIRCUIT D'OUVERTURE RAPIDE POUR TRANSISTOR A EFFET DE CHAMP A MODULATION DE CONDUCTIVITE</title><description>UN CIRCUIT DE COMMUTATION RAPIDE A L'OUVERTURE DESTINE A UN TRANSISTOR A EFFET DE CHAMP A MODULATION DE CONDUCTIVITE, OU COMFET, Q1 EVITE LA CIRCULATION DE COURANTS DE VERROUILLAGE DESTRUCTEURS. UN COURANT DE COMMUTATION A L'OUVERTURE D'AMPLITUDE REDUITE EST APPLIQUE Q3 A L'ELECTRODE DE GRILLE DU COMFET PENDANT LA PARTIE INITIALE DE LA COMMUTATION A L'OUVERTURE. LORSQUE LA TENSION SOURCE-DRAIN DU COMFET EST DEVENUE PLUS GRANDE QUE L'INTERVALLE DES BASSES TENSIONS SOURCE-DRAIN POUR LESQUELLES UN VERROUILLAGE PEUT SE PRODUIRE AVEC UN COURANT DE COMMUTATION A L'OUVERTURE D'AMPLITUDE ACCRUE, CE COURANT DE COMMUTATION A L'OUVERTURE D'AMPLITUDE ACCRUE EST APPLIQUE Q4 A L'ELECTRODE DE GRILLE DU COMFET.
A fast switch-off circuit for a conductivity modulated field effect transistor (COMFET) avoids the flow of destructive latch-up currents. A reduced-amplitude switch-off current is applied to the gate electrode of the COMFET during the initial portion of switch-off. When the source-to-drain voltage (VDS) of the COMFET has become larger than the range of low VDS voltage in which latch-up can occur for an increased-amplitude switch-off current being applied to the gate electrode of the COMFET, that increased-amplitude switch-off current is applied to the gate electrode of the COMFET.</description><subject>BASIC ELECTRONIC CIRCUITRY</subject><subject>ELECTRICITY</subject><subject>PULSE TECHNIQUE</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>1987</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNiz0LwjAQQLM4iPofbnNy8KNCx5Bc6IFNwvVS3EqROIkW6v_HIP4ApweP95bqaohNIgG7DalHlsQIrCNZhBgSg7D2HXUSGDSgc1hSBNPoNhbRBpsuWij4rw3eJiPUk-BaLe7jY86bH1cKymuaXZ5eQ56n8Zaf-T04PlT1uapPen_8I_kAiAIw1A</recordid><startdate>19871002</startdate><enddate>19871002</enddate><creator>HAROLD ROBERT RONAN JR ET CARL FRANKLIN WHEATLEY JR</creator><scope>EVB</scope></search><sort><creationdate>19871002</creationdate><title>CIRCUIT D'OUVERTURE RAPIDE POUR TRANSISTOR A EFFET DE CHAMP A MODULATION DE CONDUCTIVITE</title><author>HAROLD ROBERT RONAN JR ET CARL FRANKLIN WHEATLEY JR</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_FR2596594A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>fre</language><creationdate>1987</creationdate><topic>BASIC ELECTRONIC CIRCUITRY</topic><topic>ELECTRICITY</topic><topic>PULSE TECHNIQUE</topic><toplevel>online_resources</toplevel><creatorcontrib>HAROLD ROBERT RONAN JR ET CARL FRANKLIN WHEATLEY JR</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>HAROLD ROBERT RONAN JR ET CARL FRANKLIN WHEATLEY JR</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>CIRCUIT D'OUVERTURE RAPIDE POUR TRANSISTOR A EFFET DE CHAMP A MODULATION DE CONDUCTIVITE</title><date>1987-10-02</date><risdate>1987</risdate><abstract>UN CIRCUIT DE COMMUTATION RAPIDE A L'OUVERTURE DESTINE A UN TRANSISTOR A EFFET DE CHAMP A MODULATION DE CONDUCTIVITE, OU COMFET, Q1 EVITE LA CIRCULATION DE COURANTS DE VERROUILLAGE DESTRUCTEURS. UN COURANT DE COMMUTATION A L'OUVERTURE D'AMPLITUDE REDUITE EST APPLIQUE Q3 A L'ELECTRODE DE GRILLE DU COMFET PENDANT LA PARTIE INITIALE DE LA COMMUTATION A L'OUVERTURE. LORSQUE LA TENSION SOURCE-DRAIN DU COMFET EST DEVENUE PLUS GRANDE QUE L'INTERVALLE DES BASSES TENSIONS SOURCE-DRAIN POUR LESQUELLES UN VERROUILLAGE PEUT SE PRODUIRE AVEC UN COURANT DE COMMUTATION A L'OUVERTURE D'AMPLITUDE ACCRUE, CE COURANT DE COMMUTATION A L'OUVERTURE D'AMPLITUDE ACCRUE EST APPLIQUE Q4 A L'ELECTRODE DE GRILLE DU COMFET.
A fast switch-off circuit for a conductivity modulated field effect transistor (COMFET) avoids the flow of destructive latch-up currents. A reduced-amplitude switch-off current is applied to the gate electrode of the COMFET during the initial portion of switch-off. When the source-to-drain voltage (VDS) of the COMFET has become larger than the range of low VDS voltage in which latch-up can occur for an increased-amplitude switch-off current being applied to the gate electrode of the COMFET, that increased-amplitude switch-off current is applied to the gate electrode of the COMFET.</abstract><edition>4</edition><oa>free_for_read</oa></addata></record> |
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subjects | BASIC ELECTRONIC CIRCUITRY ELECTRICITY PULSE TECHNIQUE |
title | CIRCUIT D'OUVERTURE RAPIDE POUR TRANSISTOR A EFFET DE CHAMP A MODULATION DE CONDUCTIVITE |
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