PROCEDE ET DISPOSITIF POUR LE TEST RAPIDE DE CONDENSATEURS ET DE MATERIAUX DIELECTRIQUES

PROCEDE ET DISPOSITIF POUR LE TEST RAPIDE DE CONDENSATEURS ET DE MATERIAUX DIELECTRIQUES

The apparatus comprises a measuring unit (300) which receives a component to be tested (Cx) in series with a reference impedance in a measuring chain, a clock (100) suitable for applying repetitive stimulating pulses to the measuring chain, means for resetting the voltage at the terminals of the ref...

Ausführliche Beschreibung

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Bibliographische Detailangaben
1. Verfasser: MICHEL DE BURGAT, ANDRE LE TRAON, JEAN-CLAUDE PILET ET AMMAR SHARAIHA
Format: Patent
Sprache:fre
Schlagworte:
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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Beschreibung
Zusammenfassung:The apparatus comprises a measuring unit (300) which receives a component to be tested (Cx) in series with a reference impedance in a measuring chain, a clock (100) suitable for applying repetitive stimulating pulses to the measuring chain, means for resetting the voltage at the terminals of the reference impedance to zero during each inactive half-cycle of the stimulating pulses, sampling means (400) which sample the response at instants which are progressively shifted relative to the stimulating pulses, and a processing unit (200) which analyzes the samples taken by the sampling unit to deduce the parameters of the tested item using a Foster model.