Remote controlled test equipment for electronic circuits - uses assembly of test probes with individual operating solenoids

The equipment comprises a series of individual probes, each with its own positioning and operating mechanism, held in a common yoke. Each probe is attached to the end of a carrier and operating arm, typically of insulating material. Probe tips are normally replaceable, and measuring leads are attached to a plate on the probe shank. The operating arm is carried from a pivot attached to the yoke approximately half way along the arm. At the opposite to the probe the arm is connected to a actuating solenoid through a linkage. When the solenoid is energised the arm moves about its pivot and the probe tip makes contact with the electronic circuit to be tested. An adjusting mechanism may be provided for setting up the probes in the requisite positions. A programmed test routine may be employed for operating the solenoids. The equipment may be used for testing semiconductor chips or in a wire bonder. L'INVENTION CONCERNE UN APPAREIL D'ENTRAINEMENT PAR MOTEUR GALVANOMETRIQUE.UN MOTEUR GALVANOMETRIQUE EST ACCOUPLE AVEC UN BRAS SUPPORT D'OUTIL POUR LE DEPLACER ENTRE UNE POSITION DE REPOS ET UNE POSITION DE TRAVAIL ET AMENER L'OUTIL EN CONTACT AVEC UNE SURFACE DE TRAVAIL. LE MOTEUR GALVANOMETRIQUE RECOIT UN COURANT D'UNE SOURCE DE COURANT COMMANDEE PAR L'INTERMEDIAIRE D'UN CIRCUIT DE REACTION ET D'UN CAPTEUR DE POSITION.L'INVENTION S'APPLIQUE NOTAMMENT A UN APPAREIL DE CONTROLE OU UN APPAREIL DE SOUDAGE SUR DES MICROCIRCUITS.