ROENTGENDIFFRAKTIONSFOERFARANDE OCH -ANORDNING FOER MAETNING AV SPAENNINGAR

X-ray diffraction method and device for measuring the state of tension in metals, especially in steel or similar. One directs the primary x-ray beams (X1p, X2p) to the sample (14) that is to be investigated in at least two directions in relation to the norm (N) of their surfaces. Through the use of...

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Hauptverfasser: LINDROOS,VEIKKO, KORHONEN,MATTI, HIISMAEKI,PEKKA, SUOMINEN,LASSE
Format: Patent
Sprache:fin ; swe
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Zusammenfassung:X-ray diffraction method and device for measuring the state of tension in metals, especially in steel or similar. One directs the primary x-ray beams (X1p, X2p) to the sample (14) that is to be investigated in at least two directions in relation to the norm (N) of their surfaces. Through the use of a detector (15), one observes the diffracted x-ray beams (X1d, X2d) that are diffracted from the studied point (P) in the sample (14). The X-ray source used to generate the primary x-ray beams (X1p, X2p) is a radioisotope source (10, 11). The detector (15), with which the above mentioned diffracted X-ray beams (X1d, X2d) are observed, is comprised of a location sensing detector surface (15'), for example a semiconductor, whose photo- and/or electrical signal is transmitted to the measuring signal processing system (20), with which the tensions that shall be measured are calculated on the basis of the location sensing detector surface's (15') location observations (R1, R2) and the detector position in the plane (Xj-Xj) where the primary beams (X1p,X2p) are being transmitted. The radioisotope source is an advantageous Fe55 radiation source.