Control de un transistor de efecto de campo semiconductor de óxido metálico
The invention relates to a method and an actuation assembly (3) for actuating a MOSFET (1), in particular a MOSFET (1) based on a semiconductor with a wide band gap. According to the invention, a characteristic block is generated in which a change (ΔU1, ΔU2, ΔR1, ΔR2) in at least one actuation varia...
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Zusammenfassung: | The invention relates to a method and an actuation assembly (3) for actuating a MOSFET (1), in particular a MOSFET (1) based on a semiconductor with a wide band gap. According to the invention, a characteristic block is generated in which a change (ΔU1, ΔU2, ΔR1, ΔR2) in at least one actuation variable (U1, U2, R1, R2) for actuating the MOSFET (1) with respect to a reference actuation value of the actuation variable (U1, U2, R1, R2) is stored on the basis of at least one operating characteristic variable (U, T) which influences the switching behavior of the MOSFET (1), said change counteracting a change in the switching behavior as a result of the at least one operating characteristic variable (U, T). During the operation of the MOSFET (1), an actual value of the at least one operating characteristic variable (U, T) is ascertained, and the reference actuation value of the at least one actuation variable (U1, U2, R1, R2) is changed according to the characteristic block depending on the actual value of the at least one operating characteristic variable (U, T). |
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