Method of testing the state of materials (Machine-translation by Google Translate, not legally binding)
Method of testing the state of materials, comprising the steps of injecting an input ultrasound signal xinp (n) with a frequency f given in a sample of material to be tested, being f less than or equal to the characteristic frequency of the material under test; receive an output signal x (n) after p...
Gespeichert in:
Hauptverfasser: | , , , , |
---|---|
Format: | Patent |
Sprache: | eng ; spa |
Schlagworte: | |
Online-Zugang: | Volltext bestellen |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
Zusammenfassung: | Method of testing the state of materials, comprising the steps of injecting an input ultrasound signal xinp (n) with a frequency f given in a sample of material to be tested, being f less than or equal to the characteristic frequency of the material under test; receive an output signal x (n) after passing through the material sample; select a value for a delay between consecutive samples l; select a value for an embedded dimension e; reconstruct a phase space of the signal x (n); calculate a matrix of recurring representations; calculate the degree of determinism; and determine the presence of damage to the material for a ted value of less than 1. (Machine-translation by Google Translate, not legally binding)
Método de ensayo del estado de materiales, que comprende las etapas de inyectar una señal de ultrasonidos de entrada xinp(n) con una frecuencia f dada en una muestra de material que va a someterse a ensayo, siendo f inferior o igual a la frecuencia característica del material sometido a ensayo; recibir una señal de salida x(n) tras su paso a través de la muestra de material; seleccionar un valor para un retardo entre muestras consecutivas L; seleccionar un valor para una dimensión embebida E; reconstruir un espacio de fases de la señal x(n); calcular una matriz de representaciones recurrentes; calcular el grado de determinismo; y determinar la presencia de daños en el material para un valor de DET inferior a 1. |
---|