Device and method for the determination of nanocontact electrical characteristics between a longitudinal nanostructure and a metal track for its connection (Machine-translation by Google Translate, not legally binding)

Device and method for the determination of electrical characteristics of nanocontacts between a longitudinal nanostructure and a metal track for its connection. The device and method object of the invention make it possible to determine the contact resistance of a nanocontact between a longitudinal...

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Bibliographische Detailangaben
Hauptverfasser: SABATE VIZCARRA, NEUS, IVANOV, PETER, FIGUERAS COSTA, EDUARD, GRACIA TORTADES, ISABEL, CANE BALLART, CARLES, FONSECA CHACHARO, LUIS, SANTANDER VALLEJO, JOAQUIN, TORRES HERRERO, NURIA
Format: Patent
Sprache:eng ; spa
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Zusammenfassung:Device and method for the determination of electrical characteristics of nanocontacts between a longitudinal nanostructure and a metal track for its connection. The device and method object of the invention make it possible to determine the contact resistance of a nanocontact between a longitudinal nanostructure and a metal track to characterize said nanocontact and to be able to estimate its connection without damaging the nanostructure and without the measurement being affected by the influence of parasitic resistances. (Machine-translation by Google Translate, not legally binding) Dispositivo y método para la determinación de características eléctricas de nanocontactos entre una nanoestructura longitudinal y una pista de metal para su conexionado.El dispositivo y método objeto de la invención permiten determinar la resistencia de contacto de un nanocontacto entre una nanoestructura longitudinal y una pista de metal para caracterizar dicho nanocontacto y poder estimar su conexionado sin dañar la nanoestructura y sin que la medición se vea afectada por la influencia de resistencias parásitas.