PLATFORM FOR METROLOGY INSTRUMENTS AND USE THEREOF

The invention relates to a platform for metrology instruments, comprising a base and an upper plate that rotates on the base by means of rolling spheres, as well as kinematic couplings for anchoring the upper plate in pre-determined positions and sensors for obtaining highly precise measurements of...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser:	AGUILAR MARTIN, JUAN JOSE, SANTOLARIA MAZO, JORGE
Format:	Patent
Sprache:	eng ; spa
Schlagworte:	MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS TESTING
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Beschreibung
Zusammenfassung:	The invention relates to a platform for metrology instruments, comprising a base and an upper plate that rotates on the base by means of rolling spheres, as well as kinematic couplings for anchoring the upper plate in pre-determined positions and sensors for obtaining highly precise measurements of said positions. The invention is intended to be used with portable measuring instruments and to perform verification or calibration operations on said portable instruments. Plataforma para instrumentación de metrología y uso de la misma.Se describe una plataforma para instrumentación de metrología que dispone de una base y de una placa superior que gira sobre la misma mediante unas esferas de rodadura, y que dispone de unos acoplamientos cinemáticos para anclar la placa superior en determinadas posiciones y unos sensores capaces de medir estas posiciones con alta precisión, para su uso en combinación con instrumentos portátiles de medida y realizar procedimientos de verificación o calibración de estos equipos de instrumentación portátil.